TFOCA 1 – TFOCA GenX™ Fiber Optic Connector Adapter

Overview

Unique in its compact footprint, STRAN Technologies’ TFOCA I to TFOCA GenX Connector Adapter is designed to assist in the transition of the legacy TFOCA I tactical interconnect system to STRAN’s next generation TFOCA GenX fiber optic connector. One major advantage of this connector adapter is that it minimizes disruption and/or overhauling of existing fiber optic communication systems currently deployed throughout the world.

Applications

  • Cabinet Mounted Communication Systems
  • Deployable Military Tactical Systems
  • Harsh Environment Video/Data Transmission
  • Outdoor Fiber Optic Connectors
  • Homeland Security and Surveillance
TFOCA 1 – TFOCA GenX Connector Adapter

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Features / Options

  • First and only in the industry with 100% optically tested stainless steel alignment sleeves (TFOCA I).
  • Field demountable front inserts for improved maintainability. Less than 5½” length without dustcaps
  • Other configurations available, such as: 45° and 90° models and TFOCA GenXTM keying combinations
  • PC polish on the zirconia ferrules (TFOCA GenXTM)
  • Standard hermaphroditic adapter, both TFOCA I and TFOCA GenX connectors can be used as plug or receptacle
  • Standard hermaphroditic, or genderless dustcaps on both adapter ends
  • TFOCA GenXTM connector is fully compliant to the MIL-PRF-83526/16 specification

Specifications

Title Description
Optical Insertion Loss TFOCA GenX to TFOCA I @850nm: 4.25 dBmaxTFOCA GenX to TFOCA I @1300nm: 3.40 dBmaxTFOCA I to TFOCA GenX @850 & 1300nm: 2.25 dBmax
Vibration 10 g’s per EIA/TIA-RS-455-11
Mating Durability  2000 cycles per EIA-455-21
Thermal Shock -54°C to +71°C per TIA/EIA-455-71
Mechanical Shock  Per EIA/TIA-RS-455-11 Test Condition C
Temperature Life  250 Hours @ +85°C per EIA/TIA-RS-455-4
Corrosion Resistance  Per TIA/EIA-455-16 Test Condition C
Humidity  10 cycles per TIA/EIA-455-5
Fluid Immersion  Per TIA/EIA-455-12
Crush Resistance  450 lbs per TIA/EIA-455-12
Maintenance Aging  Per MIL-STD-1344, method 2002
Impact  Per TIA/EIA-455-2

Drawings

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